The new FISCHERSCOPE X-RAY XDAL-PCB
The FISCHERSCOPE ® X-RAY XDAL ®-PCB is our latest X-ray fluorescence instrument for the precise measurement and analysis of layer thicknesses and layer compositions on printed circuit boards (PCB). As an easy-to-use benchtop instrument, functional layers as well as smallest components and structures on printed circuit boards can be measured.
Powerful thanks to the combination of a multicollimator and a highly sensitive silicon drift detector, it ideally complements our PCB series. This is because the XDAL-PCB closes the gap between the more cost-effective entry level devices, XULM-PCB and XDLM-PCB, and our premium device, XDV-µ PCB.
May we introduce: Our newest member in the PCB series
Powerful thanks to modern silicon drift detector, the FISCHERSCOPE X-RAY XDAL-PCB is ideal for more complex measurement tasks and the measurement of very thin layers < 0.1 µm. In addition, you benefit from:
- Tungsten or chrome microfocus tube for high beam intensity and measurement precision
- 3x changeable filter for better excitation conditions for more complex tasks
- 4x changeable apertures (collimators) for optimized measurement conditions
- Smallest measurement spot Ø approx. 0.15 mm
- Highly sensitive silicon drift detector (SDD) for high-resolution results with low measurement time and improved repeatability
- Manual pull-out stage for PCBs up to 610 x 610 mm (24 x 24 in), optional sample stage extension or automatic stage
- Maximum sample height 10 mm
- Measuring distance 0…10 mm with Fischer’s patented DCM method for easy and fast adjustment of the measuring distance
- For analyses of light elements from aluminum (13) to uranium (92)
- Direct phosphorus determination of NiP layers possible
- Fulfills the requirements to measure ENIG and ENEPIG coatings
- Approval: Individual approval as full protection device according to German radiation protection law, subject to approval according to § 12 Radiation Protection Act
Interested? Our Fischer experts are available to answer any further questions you may have.
Make 4 out of 3: Our entire Fischer PCB family at a glance
With the PCB instrument series, Helmut Fischer offers specialized measurement solutions for printed circuit boards. The PCB line delivers reliably fast results for both simple and complex measurement tasks. They can also measure layer thickness down to the nanometer range. Compare our models! We will be happy to advise you on the optimal XRF device for your measurement tasks.
FISCHERSCOPE X-RAY XULM-PCB |
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Tungsten microfocus tube |
Fixed aperture |
Fixed filter |
Smallest measuring spot Ø approx. 0.15 mm |
Proportional counter tube |
Fixed table, optional with measuring table extension |
90 mm with measuring distance of 0 ... 10 mm |
DIN ISO 3497 ASTM B 568 |
FISCHERSCOPE X-RAY XDLM-PCB |
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Tungsten microfocus tube |
Fixed aperture, optional 4x changeable apertures |
Fixed filter, optional 3x changeable filter |
Smallest measuring spot Ø approx. 0.15 mm |
Proportional counter tube |
Manual pull-out or programmable table |
5 mm with measuring distance of 0 ... 10 mm |
DIN ISO 3497 ASTM B 568 |
FISCHERSCOPE X-RAY XDAL-PCB |
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Microfocus tube with tungsten or chrome |
4x changeable aperture |
3x changeable filter |
Smallest measuring spot Ø approx. 0.15 mm |
Silicon drift detector 20 mm², optionally 50 mm² |
Manually extractable table, optionally with measuring table extension or automated |
10 mm with measuring distance of 0 ... 10 mm |
DIN ISO 3497 ASTM B 568 IPC-4552-A/B IPC-4556 |
FISCHERSCOPE X-RAY XDV-µ PCB |
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Microfocus tube with tungsten or molybdenum |
4x changeable aperture |
4x changeable filter |
Smallest measuring spot Ø approx. 20 or 10 µm thanks to polycapillary optics |
Polycapillary and silicon drift detector 20 mm², optional 50 mm² |
Programmable table, optionally with vacuum holder for FLEX-PCBs |
< 4-5 mm with fixed measuring distance |
DIN ISO 3497 ASTM B 568 IPC-4552-A/B IPC-4556 |
Quality production with Fischer according to IPC-4552 and -4556
The FISCHERSCOPE X-RAY XDAL PCB and the FISCHERSCOPE X-RAY XDV-µ PCB comply with the IPC-4552-A/B and IPC-4556 standards and thus with the ENIG and ENEPIG requirements.
IPC-4556 is the authoritative specification for the plating of printed circuit boards with ENEPIG (electroless nickel/chemical palladium/immersion gold). IPC-4552-A/B for ENIG (electroless nickel/chemical gold).
The IPC specification provides detailed guidelines for the manufacturing of high quality PCB plating that provides optimum conditions for high shelf life/durability, good solderability and reliable bonds of gold, copper or aluminium wire.
Read more about the measurement according to IPC-4552B and IPC-4556A with the FISCHERSCOPE® X-RAY XDAL®-PCB 200 in our application note.
Many applications, the right solution for everyone
Our extensive portfolio of instruments offers reliable measure solutions for your printed circuit board, wafers, plug contacts, wires and other components applications. Whether determining lead content in solders or phosphorus, analyzing the composition of electroplating baths or layer structure on PCBS such as chem. Au/NiP/Cu/PCB, chem. Sn/Cu/PCB, Au/Ni/PCB, Sn/Cu/PCB, Ag/Cu/PCB, Fischer has a solution for your unique application.
What can we support you with? Our numerous case studies will give you a further information:
- Printed circuit boards
- Wafers and semiconductors
- ROHS/WEEE/EOLV/CPSIA
- Electronic components
- Lead Frames
- ENIG IPC-4552-B
The Fischer Advantage
As PCB technology transitions toward smaller structures, and increasing demands for quality control. Helmut Fischer is your partner for precise and reliable measurement technology in the field of X-ray fluorescence analysis. With out FISCHERSCOPE® X-RAY systems, we offer highly efficient measuring solutions that make your job easier.
True to our motto “Measuring Made Easy” a measuring task is easy to solve when you have the right tool for the job. Benefit from our extensive line of products for the best possible quality testing. Our company also offers detailed needs analysis, competent advice and an individual service concept.